Category: Transient Plane Source
Author(s): Alexander A. Balandin, D. Teweldebrhan, Vivek Goyal
Keywords: Annealing, Bi2Te3, Bismuth Telluride, Bismuth Telluride (Bi2Te3), Current-Voltage Characteristics, EDS, Energy Dispersive Spectroscopy, Energy Dispersive Spectroscopy (EDS), films, graphene, Laser Flash Technique, Laser Flash Technique (LFT), LFT, Materials, Mechanical Exfoliation, Micro-Raman Spectroscopy, Pseudosuperlattice, Scanning Electron Microscope, Scanning electron microscope (SEM), Seebeck Measurements, SEM, TE, Temperature, Thermal Conductivity, Thermoelectric, Thermoelectric (TE) Materials, TI, Topological Insulators, Topological Insulators (TI), TPS, Transient Plane Source, Transient plane source (TPS) method
Abstract: The 'graphene-like' mechanical exfoliation of Bi2Te3 films is shown to have a significant effect on the thermoelectric properties of these films. The modification of thermal conductivity due to exfoliation leads to enhanced thermoelectric properties, known as figures of merit (ZT).Two different experimental techniques were used in order to determine the thermal conductivity of the exfoliated films: transient plane source (TPS) and laser flash technique (LFT). Annealing was performed in order to determine its effect on thermal conductivity. Reduction of the in-plane and cross-plane thermal conductivities led to enhanced thermoelectric properties.
Reference: Applied Physics Letters 97, 133117 (2010)
DOI: 10.1063/1.3494529