Micro-Raman Spectroscopy Archives

Exfoliation and Characterization of Bismuth Telluride Atomic Quintuples and Quasi-Two-Dimensional Crystals

Author(s): Alexander A. Balandin, Desalegne Teweldebrhan, Vivek Goyal

High-quality bismuth telluride crystals having a thickness of only a few atoms were prepared by a method similar to that for graphene mechanical exfoliation. The potential for these materials to ...

Keywords: AFM, atomic force microscopy, Atomic Force Microscopy (AFM), Electrical Current-Voltage, laser flash, Micro-Raman Spectroscopy, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, TEM, Thermal Conductivity, Thermoelectric Materials, TPS Technique, Transmission electron microscopy, Transmission electron microscopy (TEM)

Thermal properties of the optically transparent pore-free nanostructured yttria-stabilized zirconia

Author(s): Alexander A. Balandin, D. Teweldebrhan, J. E. Garay, J. R. Morales, S. Ghosh

Yttria-stabilized zirconia (YSZ) was synthesized by the spark plasma sintering process to generate pore-free, homogenous bulk samples that were then tested for thermal conductivity, which was measured by two separate ...

Keywords: Advanced Electronics, Callaway-Klemens Model, Coatings, density, fuel cell, Grain Size, High Temperature Coatings, Laser Flash Technique, Laser Flash Technique (LFT), LFT, Micro-Raman Spectroscopy, Optically Transparent Thermal Insulators, Optically Transparent Thermal Insulators (OTTI), OTTI, PHM, Phonon-Hopping Model, Phonon-Hopping Model (PHM), porosity, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Solid Oxide, Spark Plasma Sintering Process, Temperature, Thermal Conductivity, Thermal Diffusivity, thermal insulation, TPS Technique, Transient Plane Source, Transient plane source (TPS) method, X-ray Diffraction, X-ray diffraction (XRD), XRD, YSZ, Yttria-Stabilized Zirconia, Yttria-Stabilized Zirconia (YSZ)

Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance

Author(s): Alexander A. Balandin, D. Teweldebrhan, Vivek Goyal

The 'graphene-like' mechanical exfoliation of Bi2Te3 films is shown to have a significant effect on the thermoelectric properties of these films. The modification of thermal conductivity due to exfoliation ...

Keywords: Annealing, Bi2Te3, Bismuth Telluride, Bismuth Telluride (Bi2Te3), Current-Voltage Characteristics, EDS, Energy Dispersive Spectroscopy, Energy Dispersive Spectroscopy (EDS), films, graphene, Laser Flash Technique, Laser Flash Technique (LFT), LFT, Materials, Mechanical Exfoliation, Micro-Raman Spectroscopy, Pseudosuperlattice, Scanning Electron Microscope, Scanning electron microscope (SEM), Seebeck Measurements, SEM, TE, Temperature, Thermal Conductivity, Thermoelectric, Thermoelectric (TE) Materials, TI, Topological Insulators, Topological Insulators (TI), TPS, Transient Plane Source, Transient plane source (TPS) method

Keyword: Micro-Raman Spectroscopy

Exfoliation and Characterization of Bismuth Telluride Atomic Quintuples and Quasi-Two-Dimensional Crystals

Thermal properties of the optically transparent pore-free nanostructured yttria-stabilized zirconia

Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance

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