Exfoliation and Characterization of Bismuth Telluride Atomic Quintuples and Quasi-Two-Dimensional Crystals
Author(s): Alexander A. Balandin, Desalegne Teweldebrhan, Vivek Goyal
High-quality bismuth telluride crystals having a thickness of only a few atoms were prepared by a method similar to that for graphene mechanical exfoliation. The potential for these materials to ...
Keywords: AFM, atomic force microscopy, Atomic Force Microscopy (AFM), Electrical Current-Voltage, laser flash, Micro-Raman Spectroscopy, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, TEM, Thermal Conductivity, Thermoelectric Materials, TPS Technique, Transmission electron microscopy, Transmission electron microscopy (TEM)
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