Micro-Raman Spectroscopy Archives

Exfoliation and Characterization of Bismuth Telluride Atomic Quintuples and Quasi-Two-Dimensional Crystals

Author(s): Alexander A. Balandin, Desalegne Teweldebrhan, Vivek Goyal

High-quality bismuth telluride crystals having a thickness of only a few atoms were prepared by a method similar to that for graphene mechanical exfoliation. The potential for these materials to ...

Keywords: AFM, atomic force microscopy, Atomic Force Microscopy (AFM), Electrical Current-Voltage, laser flash, Micro-Raman Spectroscopy, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, TEM, Thermal Conductivity, Thermoelectric Materials, TPS Technique, Transmission electron microscopy, Transmission electron microscopy (TEM)

Properties of graphene produced by the high pressure-high temperature growth process

Author(s): Alexander A. Balandin, D. Teweldebrhan, F. Parvizi, H. Zhu, I. Calizo, R. Abbaschian, S. Ghosh

In this article, the authors present a novel method for the synthesis of graphene layers that can be used in advanced electronic devices, among other applications. The preparation method involves ...

Keywords: density, electronics, graphene, Growth Process, High-Pressure High-Temperature, High-Pressure High-Temperature (HPHT) Growth Process, Hot Disk Transient Plane Source, Hot Disk transient plane source (TPS), HPHT, Micro-Raman Spectroscopy, Nanoelectric Circuits, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Semiconductors, Thermal Conductivity, TPS Method

Thermal properties of the optically transparent pore-free nanostructured yttria-stabilized zirconia

Author(s): Alexander A. Balandin, D. Teweldebrhan, J. E. Garay, J. R. Morales, S. Ghosh

Yttria-stabilized zirconia (YSZ) was synthesized by the spark plasma sintering process to generate pore-free, homogenous bulk samples that were then tested for thermal conductivity, which was measured by two separate ...

Keywords: Advanced Electronics, Callaway-Klemens Model, Coatings, density, fuel cell, Grain Size, High Temperature Coatings, Hot Disk, Laser Flash Technique, Laser Flash Technique (LFT), LFT, Micro-Raman Spectroscopy, Optically Transparent Thermal Insulators, Optically Transparent Thermal Insulators (OTTI), OTTI, PHM, Phonon-Hopping Model, Phonon-Hopping Model (PHM), porosity, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Solid Oxide, Spark Plasma Sintering Process, Temperature, Thermal Conductivity, Thermal Diffusivity, thermal insulation, TPS Technique, Transient Plane Source, Transient plane source (TPS) method, X-ray Diffraction, X-ray diffraction (XRD), XRD, YSZ, Yttria-Stabilized Zirconia, Yttria-Stabilized Zirconia (YSZ)

Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance

Author(s): Alexander A. Balandin, D. Teweldebrhan, Vivek Goyal

The 'graphene-like' mechanical exfoliation of Bi2Te3 films is shown to have a significant effect on the thermoelectric properties of these films. The modification of thermal conductivity due to exfoliation ...

Keywords: Annealing, Bi2Te3, Bismuth Telluride, Bismuth Telluride (Bi2Te3), Current-Voltage Characteristics, EDS, Energy Dispersive Spectroscopy, Energy Dispersive Spectroscopy (EDS), films, graphene, Laser Flash Technique, Laser Flash Technique (LFT), LFT, Materials, Mechanical Exfoliation, Micro-Raman Spectroscopy, Pseudosuperlattice, Scanning Electron Microscope, Scanning electron microscope (SEM), Seebeck Measurements, SEM, TE, Temperature, Thermal Conductivity, Thermoelectric, Thermoelectric (TE) Materials, TI, Topological Insulators, Topological Insulators (TI), TPS, Transient Plane Source, Transient plane source (TPS) method

Thermal Conductivity of Nitrogenated Ultrananocrystalline Diamond films on Silicon

Author(s): A. Popovich, Alexander A. Balandin, I. Calizo, M. Shamsa, S. Ghosh, V. Ralchenko

Thermal conductivity testing was done on nitrogenated ultrananocrystalline diamond films on silicon using 3 method and transient Hot Disk technique. Temperature dependence on thermal conductivity was measured using these two techniques. ...

Keywords: 0% nitrogen, 25% nitrogen, films, Heat Capacity, Mass Density, MCD, Metal-oxide-semiconductors, Micro-Raman Spectroscopy, Microcrystalline Diamond, Microcrystalline Diamond (MCD), Nitrogentated Ultrananocrystalline Diamond, Nitrogentated Ultrananocrystalline Diamond (UNCD) at 25% nitrogen and at 0% nitrogen., PCD, Photon-photon Interactions, Polycrystalline Diamond, Polycrystalline Diamond (PCD), Resistance, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Temperature, Thermal Conductivity, Thermal Conductivity Measurement, Thermal Diffusivity, TPS, Transient Plane Source, Transient plane source (TPS) method, UCD, Ultrananocrystalline Diamond, Ultrananocrystalline Diamond (UCD), UNCD, Velocity, X-ray Diffraction, X-ray diffraction (XRD), XRD

Keyword: Micro-Raman Spectroscopy

Exfoliation and Characterization of Bismuth Telluride Atomic Quintuples and Quasi-Two-Dimensional Crystals

Properties of graphene produced by the high pressure-high temperature growth process

Thermal properties of the optically transparent pore-free nanostructured yttria-stabilized zirconia

Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance

Thermal Conductivity of Nitrogenated Ultrananocrystalline Diamond films on Silicon

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