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Author(s): , , , , ,

Keywords: , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , ,

Abstract: Thermal conductivity testing was done on nitrogenated ultrananocrystalline diamond films on silicon using 3 method and transient Hot Disk technique. Temperature dependence on thermal conductivity was measured using these two techniques. A decrease in thermal conductivity was observed with the introduction of nitrogen addition. It was observed that MCD had the highest thermal conductivity followed by UNCD at 25% nitrogen and UNCD at 0% nitrogen.

Reference: Journal of Applied Physics 103, (2008)

DOI: 10.1063/1.2907865