Category: Transient Plane Source
Author(s): Alexander A. Balandin, D. Teweldebrhan, J. E. Garay, J. R. Morales, S. Ghosh
Keywords: Advanced Electronics, Callaway-Klemens Model, Coatings, density, fuel cell, Grain Size, High Temperature Coatings, Laser Flash Technique, Laser Flash Technique (LFT), LFT, Micro-Raman Spectroscopy, Optically Transparent Thermal Insulators, Optically Transparent Thermal Insulators (OTTI), OTTI, PHM, Phonon-Hopping Model, Phonon-Hopping Model (PHM), porosity, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Solid Oxide, Spark Plasma Sintering Process, Temperature, Thermal Conductivity, Thermal Diffusivity, thermal insulation, TPS Technique, Transient Plane Source, Transient plane source (TPS) method, X-ray Diffraction, X-ray diffraction (XRD), XRD, YSZ, Yttria-Stabilized Zirconia, Yttria-Stabilized Zirconia (YSZ)
Abstract: Yttria-stabilized zirconia (YSZ) was synthesized by the spark plasma sintering process to generate pore-free, homogenous bulk samples that were then tested for thermal conductivity, which was measured by two separate methods: TPS and LFT. The TPS method was found to be better for measuring of thermal conductivity in this specific case. Using the phonon-hopping model (PHM) the authors were able to determine how grain boundaries of the bulk samples affected the measured thermal conductivities.
Reference: Journal of Applied Physics 106, 113507 2009
DOI: 10.1063/1.3264613