Category: Transient Plane Source
Author(s): Chia-Jyi Liu, Gao-Jhih Liu, Liang-Ru Chen, Yen-Liang Liu
Keywords: AFM, Atomic Force Microscope, Atomic Force Microscope (AFM), Cold Pressing, EDX, Electrical Resistivity, Energy Dispersive X-Ray, Energy Dispersive X-Ray (EDX) Spectrometry, FE-SEM, Field Emission Scanning Electron Microscopy, Field Emission Scanning Electron Microscopy (FE-SEM), Figure of Merit, Figure of Merit (ZT), Hydrothermal Method, Materials, Powder X-Ray Diffraction, Powder X-Ray Diffraction (XRD), Power Factor, Seebeck Voltage, Sintering Temperature, Spectrometry, TE, TEM, Temperature, Thermal Conductivity, Thermoelectric, Thermoelectric (TE) Materials, TPS Method, Transient Plane Source, Transient plane source (TPS) method, Transmission electron microscopy, Transmission electron microscopy (TEM), XRD, ZT
Abstract: A series of compacted Bi0.5Sb1.5Te3 nanoplatelets are synthesized using hydrothermal methods, followed by cold pressing and sintering at temperatures between 300°C and 380°C. A variety of thermal, mechanical and electrical analyses are then performed on the synthesized nanoplatelets including: TPS technique for thermal conductivity, SEM/TEM/AFM to elucidate the mechanical and physical properties of the nanoplatelets, and the Oxford closed cycle cooler cryostat for measurement of electrical resistivity. The nanoplatelet sample that was sintered at 340°C resulted in the best combination of thermal, electrical and mechanical properties.
Reference: Journal of Materials Research, 26, 15 (2011) 1755-1761
DOI: 10.1557/jmr.2011.158