Category: Transient Plane Source
Author(s): Bo-Rong Wu, Chia-Hung Wu, Chia-Wei Liao, Ming-Der Ger, Nen-Wen Pu, Yih-Ming Liu
Keywords: electrical resistivity, fillers, graphite, pcms, phase change materials, praffin wax, raman spectroscopy, scanning electron microscopy, scanning electron microscopy (sem), sem, thermal conductivity, transient plane heat source method, x-ray photoelectron spectrometer, x-ray photoelectron spectrometer (xps), xps
Abstract: Pristine and modified exfoliated graphite nanoplatelets (xGnPs and M-xGnPs, respectively) were dispersed into a paraffin wax phase change material (PCM) in an effort to raise the thermal conductivity of the PCM. The addition of pure xGnPs would decrease the electrical resistivity of the composite PCM, and thus its potential for use in electrical devices would be limited due to safety concerns. To eliminate this issue, the M-xGnPs were prepared. Samples containing either xGnPs or M-xGnPs were found to have increasing thermal conductivities as the mass fraction of nanoplatelets was increased. Those samples containing M-xGnPs were found to have a slightly reduced thermal conductivity than those containing xGnPs at all mass fractions; however, it was not expected that this slight reduction would severely limit the applications for these materials.
Reference: Microelectronic Engineering 138 (2015) 91–96
DOI: 10.1016/j.mee.2015.02.039