Category: Transient Plane Source
Author(s): H. Nagai, T. Okutani
Keywords: anisotropy, Bulk material, ceramics, Coatings, Complex geometry, films, heat flow, metal, probe, Sensor, Single sided, Solids, Thermal Analysis, Thermal Conductivity, thermal contact resistance, Thermal Resistance, thermal transport properties, Thin, Transient hot-strip (THS), Transient plane source (TPS), Transient plane source (TPS) method
Abstract: The transient plane source (TPS) technique has a wide range of applications because of its capability to test solids, liquids, powders, and anisotropic materials over a range of sizes. Thermal properties of thin films and coatings can also be characterized using the TPS method if the samples are placed between the sensor and a bulk background. To minimize errors with the TPS method, use identical materials on each side of the sensor, eliminate contact resistance between the probe and samples, and use a highly conductive material on side A of the sensor if insulating side B of the sensor as much as possible.
Reference: Solid State Phenomena, 124-126 (2007) 1641-1644