Category: Transient Plane Source
Author(s): H. Nagai, T. Okutani
Keywords: anisotropy, bulk material, ceramics, coatings, complex geometry, films, heat flow, metal, probe, sensor, single sided, solids, thermal analysis, thermal conductivity, thermal contact resistance, thermal resistance, thermal transport properties, thin, transient hot-strip (ths), transient plane source (tps), transient plane source (tps) method
Abstract: The transient plane source (TPS) technique has a wide range of applications because of its capability to test solids, liquids, powders, and anisotropic materials over a range of sizes. Thermal properties of thin films and coatings can also be characterized using the TPS method if the samples are placed between the sensor and a bulk background. To minimize errors with the TPS method, use identical materials on each side of the sensor, eliminate contact resistance between the probe and samples, and use a highly conductive material on side A of the sensor if insulating side B of the sensor as much as possible.
Reference: Solid State Phenomena, 124-126 (2007) 1641-1644
DOI: 10.4028/www.scientific.net/SSP.124-126.1641