Author(s): ,

Keywords: , , , , , , , , , , , , , , ,

Abstract: This work introduces a direct method for measuring the specific heat of solids, using the Transient Plane Source Technique (TPS). To begin, a sample is placed into a thermally conductive holder, surrounded by a thermally insulating material. A thermally conductive sample holder is used, to limit the time it takes to achieve a temperature equilibrium between the holder and the sensor. Insulating the sample holder is to minimize heat loss to the external environment. As compared to standard TPS measurements, relatively longer test times are required for specific heat measurements. During this time, the temperature increase of the sensor is recorded continuously. This temperature increase is then compared to a previous empty-cell experiment, referred to as a reference. From this comparison, it is possible to deduce the specific heat of the sample, so long as the temperature increases between the two measurements are similar.

Reference: Thermal Conductivity 23 Thermal Expansion 11