Category: Transient Plane Source
Author(s): Manabu Fukushima, Yu-ichi Yoshizawa
Keywords: Freeze-drying, Gelation, Microstructure, morphology, porosity, Porous, Silica, Silica insulators, Thermal Conductivity, thermal insulation, Transient plane source (TPS) method
Abstract: The purpose of this study was to produce high porosity silica thermal insulators through gelation-freezing. The thermal conductivities of the insulators in relation to porosity and microstructure were measured by a thermal constant analyzer based on the transient plane source (TPS) method. The thermal conductivities of the S1 and S10 samples remained fairly constant despite temperature changes, and were mainly affected by solid and gas conduction.
Reference: Journal of the American Ceramic Society, 97, 3 (2014) 713-717