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Abstract: The purpose of this study was to produce high porosity silica thermal insulators through gelation-freezing. The thermal conductivities of the insulators in relation to porosity and microstructure were measured by a Hot Disk thermal constant analyzer TPS1500 based on the transient plane source (TPS) method. The thermal conductivities of the S1 and S10 samples remained fairly constant despite temperature changes, and were mainly affected by solid and gas conduction.

Reference: Journal of the American Ceramic Society, 97, 3 (2014) 713-717

DOI: 10.1111/jace.12723