Category: Transient Plane Source
Author(s): Chia-Jyi Liu, Hsin -Chang Lai, Liang-Ru Chen, Yen-Liang Liu, Yi-Yan Zou
Keywords: Electrical Resistivity, Thermal Conductivity, Thermoelectric Materials, Thermopower, Transient Plane Source Technique, X-ray Diffraction, X-ray diffraction (XRD), XRD
Abstract: Bi2-xSbxTe3 thermoelectric materials, where x = 1.52 and 1.55 were prepared and evaluated for their thermoelectric properties. Three samples in total were prepared, two with x = 1.52 and 1.55 were synthesized at 140oC and one with x = 1.55 was synthesized at 160 oC. It was determined that the two samples synthesized at the higher temperature had lower resistivity than that which was synthesized at higher temperature. The figure of merit for the sample synthesized at 140oC, however, was higher because it had a higher thermopower. The thermal conductivity for each of the three samples was found to be low.
Reference: Journal of Electronic Materials, 42, 7 (2013) 1550-1554