Category:

Author(s): , , ,

Keywords: , , , , , , , , ,

Abstract: This study experiments with the new and improved transient plane source (TPS) method for measuring the thermal conductivity of thin-films. The existing TPS method for measuring thin-films experiences the effect of thermal contact resistance. In this experiment, a hot disk TPS 2500S thermal constants analyzer is used to investigate the precision and efficacy of the new method. This modified method looks to resolve the issues surrounding contact resistance, with eliminating the need for reference tests, and noisy data resulting from the Kapton and background material layers. Although the new method generates accurate results, it requires the testing of two sample thicknesses, which may pose problems with limited material availability. The results from the modified method were compared against values from the guarded hot plate method, to ensure accuracy. Minimal differences were noted; however, they highlight the importance of selecting a proper thermal conductivity measurement method.

Reference: International Journal of Heat and Mass Transfer, 96 (2016): 371–380

DOI: 10.1016/j.ijheatmasstransfer