The phase behavior of polymeric materials is understood through glass transition temperature. It is a temperature boundary above which the polymeric material is soft and viscous, and becomes hard, brittle, ...Read More
Papers Author: Vishal Mathur
Evaluation of Morphological Effect on Thermal and Mechanical Performance of PS/PMMA/CdS Nanocomposite Systems
The thermal and mechanical properties of PS/PMMA immiscible polymer blends were investigated. The effects of the dispersion of CdS nanoparticles on these properties were also investigated. The dispersion of ...
Keywords: DMA, Dynamic Mechanical Analyzer, Dynamic Mechanical Analyzer (DMA), Glass Transition Temperature, nanocomposites, Polymer composites, SAXS, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Small-Angle X-Ray Scattering, Small-Angle X-Ray Scattering (SAXS), Thermal Conductivity, Thermal Diffusivity, TPS Technique, Transient Plane Source, Transient plane source (TPS) method, WAXS, Wide Angle X-Ray Scattering, Wide Angle X-Ray Scattering (WAXS)Read More
Effect of nano CdS dispersion on thermal conductivity of PS/PVC and PS/PMMA polymeric blend nanocomposites
The goal of this study was to determine how adding CdS nanoparticles to two polymer blends (PS/PVC and PS/PMMA) affects their thermal conductivities. Also, the effect of increasing ...Read More
Evaluation of energy band gap, thermal conductivity, phase transition temperature and elastic response of PS/CdS semiconducting optical nanocomposite
Cadmium sulfide (CdS) nanoparticles were dispersed in a polystyrene (PS) matrix to synthesize semiconducting optical nanocomposites for industrial applications. In this paper, many characteristics of the PS-CdS thick films were ...
Keywords: Cadmium sulfide (CdS), Cadmium sulphide (CdS), Energy band gap, Fillers, films, matrix, morphology, nanocomposites, Nanofiller, Optical absorption, Phase transition, Polystyrene (PS), Scanning Electron Microscopy (SEM), Semiconducting, Temperature, Thermal Conductivity, Transient plane source (TPS), Transient plane source (TPS) method, Transmission electron microscopy (TEM), X-ray DiffractionRead More