Category: Transient Plane Source
Keywords: Analytical solution, films, Hot Disk, measurement, numerical simulation, Thermal Conductivity, Thermal Properties, Transient Plane Source, Transient plane source (TPS) method, Vacuum insulation panel
Abstract: Researchers at the Chalmers University of Technology used the transient plane source (TPS) method to propose a technique for testing layered materials of a low conductive core, coated in a highly conductive thin film. The accuracy of the method to evaluate isotropic materials was tested prior to testing the ability of the TPS to analyze layered materials. Value differences were noted between the simulated and the measured temperature increases of the set-up. These differences could in part be due to the surface contact heat resistances and/or the loss of heat in the wire from traveling from the TPS sensor to the TPS unit. More research and testing is required for an analytical solution to be modeled in order to eventually be able to determine the thermal properties of the material from the temperature increase of the sensor.
Reference: Frontiers of Architectural Research (2012) 1(4): 334–340