Category: Transient Plane Source
Author(s): C. Dohare, N. Mehta
Keywords: Chalcogenide Glasses, Dielectric Measurements, differential scanning calorimetry, Differential scanning calorimetry (DSC), DSC, Effective Thermal Diffusivity, glass, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Thermal Conductivity, Transient Plane Source Technique, Vickers Hardness, X-ray Diffraction, X-ray diffraction (XRD), XRD
Abstract: The influence of In content in the Se98-xAg2Inx (x = 0, 2, 4, 6) system of chalcogenide glasses on the physical properties of the glasses were investigated by the authors. The maximum thermal conductivity and thermal diffusivity value was observed for the sample containing 2 at. % In. The microhardness was found to initially decrease upon doping of In for Se; however, it began to slowly increase after a certain In content had been attained. It was concluded that the doping of In into the system resulted in an improvement in the thermomechanical properties of the chalcogenide glasses.
Reference: Canadian Journal of Physics, 92, 7/8 (2014) 648-653