Category: Transient Plane Source
Author(s):
Keywords: Thermal Conductivity, Thermal conducvitivy of solids, thermal constants analyser, Thermal Diffusivity, Thermal properties of solids, Thin samples, Transient Plane Source, Transient plane source (TPS) method
Abstract: Thermal Constants Analysers are designed to test three-dimensional samples with sizes at least as large as the sensor itself. However, this study examines the possibility of using methods to test the thermal conductivity of thin solid samples when they are thermally insulated. To accomplish this, the 200 data points that are collected by TPS methods should be collected while the sample is heated for only 5 seconds, which is a shorter amount of time than a larger, three-dimensional sample would typically be monitored.
Reference: In: Thermal Conductivity 25 (2000) 203-210
DOI: N/A