Category: Transient Plane Source
Author(s): Anusaiya Kaswan, Dinesh Patidar, K. B. Sharma, Kananbala Sharma, N. S. Saxena, Vandana Kumari
Keywords: Chalcogenide Glasses, Effective Thermal Conductivity, Effective Thermal Diffusivity, glass, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, TPS, Transient Plane Source, Transient plane source (TPS) method, X-ray Diffraction, X-ray diffraction (XRD), XRD
Abstract: The effective thermal conductivity and thermal diffusivity was measured for chalcogenide glass samples of the formulation Ge30-xSe70Sbx (x = 10, 15, 20, 25). It was found that both the effective thermal conductivity and thermal diffusivity were independent of temperature up to 160º C. After this point, both properties were found to increase with increasing temperature until they reached a maximum value at a point near the glass transition temperature of the glass. After reaching this maximum, the values were found to decrease. The experimental results were used to develop empirical equations for predicting the effective thermal conductivity and thermal diffusivity. It was found that the equation was in good agreement with the experimental results.
Reference: Journal of Asian Ceramic Societies, 3, 3 (2015) 339-344