
Steady-State Thermoreflectance (SSTR-F) on Electronic Components
Overview
Proper thermal management in electronics is crucial for reliability, speed, and efficiency. With thermal conductivity playing an important role in making electronics perform properly, we will explore ways to measure thermal conductivity using Steady-State Thermoreflectance fiber optics (SSTR-F). Silicone, non-silicone gap pads, gap filling materials and potting of resins are common techniques for thermal management in electronics and with the components in these electronics becoming smaller and more complex this requires more accurate tools for the measurement of thermal conductivity in them at the micro and nano scale.
Steady-state thermoreflectance-fiber (SSTR-R) is an optical measurement technique used to measure the thermal conductivity or boundary conductance of thin films and coatings ranging from a few nanometers up to tens of microns. Use of traditional steady state concepts in combination with a laser based pump-probe configuration allows for measurements of the thermal conductivity of materials from 0.05 W/m/K up to 2,500 W/m/K. We will discuss the measurement principles as well as a few emerging application spaces.
About the Speaker
Date
May 4, 2021