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Abstract: Semiconductor chalcogenide glasses are used in a wide range of applications as solid-state devices, both in scientific and technological fields. In this article, the mechanism of degradation of these materials is studied. The Hot Disk TPS technique was used to measure the variation of thermal conductivity and thermal diffusivity of samples with different exposure times to neutron irradiation. Thermal conductivity and diffusivity increases proportionally with smaller exposure time, while at higher exposure times a decrease of thermal conductivity is observed.

Reference: Materials Sceince and Engineering: A on ScienceDirect (2003), 346(1-2): 287-289

DOI: 10.1016/S0921-5093(02)00550-6