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Author(s): , ,

Keywords: , , , , ,

Abstract: A series of polycrystalline Sn1-xNaxSe with x = 0.00, 0.02, 0.04, 0.10 were fabricated using hydrothermal synthesis, followed by evacuated-and-encapsulated sintering. Their thermoelectric properties were then evaluated. The Hot Disk thermal constant analyser TPS 2500 S was used to find the thermal conductivity of each system by using the transient plane source (TPS) technique. The thermal conductivity was then used in determining the thermoelectric figure-of-merit, the ZT value of the system.

Reference: Journal of Electronic Materials (2016), 46:2964-2968

DOI: 10.1007/s11664-016-5084-2