Category: Transient Plane Source
Author(s): Chao Hao Peng, Hong Yi Gao, Xiong Peng, Yi Luan, Zhao Kui Jin
Keywords: FESEM, Field Emission Scanning Electron Microscopy, Field Emission Scanning Electron Microscopy (FESEM), Nitrogen Adsorption, Silica Aerogel Insulation, Static Compression Test, Thermal Analysis, thermal insulation, TiO2 Nanowires, Transient Plane Source, Transient plane source (TPS) method, X-ray Diffraction, X-ray diffraction (XRD), XRD
Abstract: The potential for the use of silica aerogels doped with TiO2 nanowires as thermal insulators was evaluated. It was found that the TiO2-doped aerogels showed good thermal insulation properties and that other desirable properties were retained upon the addition of TiO2 nanowires.
Reference: Key Engineering Materials, 633 (2014) 336-339
DOI: 10.4028/www.scientific.net/KEM.633.336