Category: Transient Plane Source
Author(s): H. Wang, R. B. Dinwiddie
Keywords: Electrical Conductivity, glass, Heat Capacity, IR imaging, robax, Thermal Conductivity, TPS, Transient Plane Method, Transient plane source (TPS) method, zeon disks
Abstract: The transient plane source sensors were used to measure thermal conductivity and other thermophysical properties of infrared transparent materials, while under infrared imaging. The infrared imaging provided evidence of temperature uniformity and symmetry, as well as temperature monitoring of the sensor and material being tested. The upgraded version of the original TPS system was used including a bridge circuit, a digital voltmeter, and a data analysis module
Reference: Thermal Conductivity 28 Thermal Expansion 16 (2005) DEStech Pub. 199-207
DOI: N/A