The transient plane source technique (TPS) to measure thermal conductivity and its potential as a tool to detect in-homogeneities in metal foams
Author(s): A. Fernandez, D. Lehmhus, J. A. de Saja, J. A. Reglero, M. A. Rodriguez-Perez, M. Wichmann, Miguel-Ángel Rodríguez-Pérez
The present study used the transient plane source (TPS) technique to measure the thermal conductivity of a series of AlSi7 metal foams prepared by the powder metallurgical route. The main ...
Keywords: density, Detection of In-Homogeneties, In-Homogeneities, Powder Metallurgical Route, quality control, Scanning Electron Microscopy, Scanning Electron Microscopy (SEM), SEM, Thermal Conductivity, TPS Technique, Transient Plane Source, Transient plane source (TPS) method
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